Extraction of Topological Features of Integrated Circuit from Grey-Scale Image
نویسندگان
چکیده
A method for integrated circuit image processing is proposed. It makes easier a topology reconstruction process and is able to successfully process images scanned from an integrated circuit layer. Implementation of image analysis techniques accelerates the process of reverse engineering as well as a quality control and analysis of integrated circuits. The idea of sequential raster-to-vector and vector-to-raster transforms was implemented.
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